The TFS Spectra 300 is a state-of-the-art FEG Scanning Transmission Electron Microscope (S/TEM) with a high-tension voltage range of 30 kV – 300 kV. It is completely enclosed in a casing, specially designed to dampen acoustic and temperature variations from the environment. This enclosure not only makes it possible to …

The Talos L120C Electron microscope is a robust tool routinely used for initial screening of a biological sample’s purity and homogeneity. The main application at the ER-C is negative staining – a heavy metal embedding of purified proteins at room temperature (see image). In addition, the evaluation of sample quality …

The Krios G4 (Thermo-Fisher Scientific) is a 300 kV FEG cryo-electron microscope with X-FEG field emitter and a three-lens condenser system. The detector options are a Gatan BioContinuum energy filter mounted K3 direct electron detection camera and a bottom mounted Falcon 4(i) detector (FEI). Combined with fringe-free imaging (FFI) and …

The Thales TH9438 9“ is an X-ray detector.

ThermoFischer Themis 300

Probe Corrected (S)TEM

Configuration

• High Tension: 80, 200, 300 kV
• X-FEG
• Aberration corrected (STEM)
• BF-/seg. DF-/HAADF-STEM detector
• Super-X EDX detector
• Dectris pixelated detector
• NanoMegas ASTAR system

Resolution

300 kV

Point Resolution TEM [nm]: 0.2
Information Limit TEM [nm]: 0.1
Resolution STEM [nm]: 0.08

200 kV

Point Resolution …

Double Corrected Analytical (S)TEM

Configuration

• High Tension: 60, 80, 300 kV
• X-FEG
• Monochromator
• Double aberration corrected (TEM and STEM)
• Super-X EDX detector
• BF-/seg. DF-/HAADF-STEM detector
• Gatan Oneview IS camera
• Gatan GIF Continuum 970 HighRes + K3 IS camera

Resolution

300 kV

Information Limit TEM [nm] : 0.06
Information Limit field-free …

A Talos F200i Transmission Electron Microscope. It has an XFEG with alignments for both 80kv and 200kV, and is capable of HRTEM or STEM imaging. The microscope has the following capabilities:
- NANOMEGAS (Precession Electron Diffraction & Strain mapping solution for TEM/STEM)
- CETA 16M camera (4kx4k)
- Brueker Dual-X …

TBD

Electron source

• Type: S-FEG
• Accelerating voltages: 80 kV, 300 kV
• Brightness: ~108 A cm-2 sr-1

Illumination

• 3-condenser lens system

Imaging

• Objective: S-Twin lens with imaging corrector (CEOS)
• TEM information limit: 0.10 nm
• STEM-HAADF resolution: 0.136 nm

Cameras and detectors

• 4-megapixel CCD camera (Gatan, UltraScan 1000) for TEM
• High-angle annular dark-field …

Hyperspectral imaging system acquiring 100 spectral channels between 500 and 1000 nm with a spectral resolution of 5 nm and image resolution of 640 x 480 px; CE-certified;

A new experiment has recently become available that allows scanning a sample through the focal point of a focused laser beam. In combination with a selective collection of the fluorescence emission, this allows the scanning of a sample with a spatial resolution of ~30 µm, without loss of the speciation …

In cooperation between HZDR and TU Dresden, a novel measurement principle on the basis of transducer arrays was developed fitted to the particular requirements of measurements in liquid metal flows. The application of specific excitation methods as a simultaneous acquisition on several measuring lines and an interlaced pulsing strategy allows …

The microscope is operated by the IMAGING Cluster at Karlsruhe Institute of Technology.

Equipment and capabilities include:
• Variable temperature range: 50 K < T < 500 K (liquid N2 and option for He cooling)
• x-y translation stage
• Access for optical microscope
• STM tunneling spectroscopy
• High resolution quartz tuning fork AFM
• Magnetic Force Microscopy (MFM) option
• Direct …

The Underwater Vision Profiler 5 was developed at the Laboratoire d’Océanographie de Villefranche-sur-Mer (LOV) to provide consistent measurements of particle abundance and size. Using the standard settings, the UVP5 images a volume of about 1 L at a frequency of 6 to 20 Hz and can be deployed down to …

The Underwater Vision Profiler 6 (Picheral et al. 2022) is an instrument developed to in situ count and size particles larger than 80 µm equivalent spherical diameter (ESD) and to obtain images for further identification of particles larger than 1000 µm ESD. The high frequency version (UVP6HF) can be deployed …

Versatile high-resolution Atomic Force Microscope - AFM

Major operating modes:
• PeakForce tapping mode with ScanAsyst
• QNM (quantitative nanoscale mechanical characterization)
• Tapping / contact mode
• STM mode (scanning tunneling microscopy)
• Force spectroscopy
• Lateral force microscopy (LFM)
• Magnetic force microscopy (MFM)
• TUNA module (electrical …