Equipment

STOE StadiVari goniometer
DECTRIS PILATUS pixel detector (300 K)
Microfoci X-ray sources (Cu- and Mo-radiation)

Single-crystal X-ray diffraction (SC-XRD) is the most powerful and reliable method for structure determination of chemical substances in the solid state. It allows us to identify the three-dimensional atomic arrangement of a chemical compound, as well as bond lengths, bond angles and intermolecular interactions. The structure information derived from SC-XRD …

Stereo microscope SMZ 745T (Nikon)

FEI Strata 400 DualBeam FIB equipped with an Omniprobe micromanipulator, Oxford EDX system and GIS (Pt, W, C, SiO2).

This system is designed to be accommodated on AWI’s in house developed underwater-winches (Lochthofen et al. 2021), which are designed to be deployed on moorings for year-round operation. It is consisting of a camera housing incorporating an industrial camera with 4Mpixel and a computing unit as well as a light …

The cryogenically cooled NIRvana® LN is unbeatable on sensitivity. For the faintest samples and the longest exposures, the NIRvana® LN can deliver exposure times of 60+ minutes.

• 850 – 1550nm SWIR / NIR-II
• Most sensitive SWIR camera
• 15e- Read Noise
• 10e- Dark Current

Elektronenquelle

• Typ: X-FEG
• Beschleunigungsspannung: 200 kV
  Richtstrahlwert: 1.8 x 109 A cm-2 sr-1 (bei 200 kV)

Beleuchtung

• 2-Kondensorlinsen-System

Abbildung

• Objektiv: A-Twin-Linse
• TEM-Informationslimit: 0.12 nm
• TEM-Punktauflösung: 0.25 nm
• STEM-HAADF-Auflösung: 0.16 nm

Kameras und Detektoren

• 16-Megapixel CMOS-Kamera (FEI Ceta 16M) für TEM
• Großwinkeldunkelfelddetektor (HAADF) für STEM
• On-Axis Hellfeld-/Dunkelfeld-Detektor (BF/DF) für STEM

Energiedispersive …

The Tecnai F20 is a S/TEM microscope.

A combination of Plasma FIB and field-free UHR FE-SEM for multiscale materials characterization

Tescan on Amber X

Tescan Solaris X DualBeam FIB equipped with Omniprobe micromanipulator and option for 3D Slice&View and TEM sample preparation.
The Tescan Solaris X, is a combination of a scanning electron microscope (SEM) and a focused ion beam (FIB) system, which allows imaging and structuring of materials at the nanoscale.

Configuration

• Operation …

The Tescan Tensor STEM is an integrated analytical precession-assisted 4D-STEM instrument for multimodal characterization of nanoscale morphological, chemical, structural and crystallographic properties of a wide range of materials systems. It is equipped with a Schottky field emission electron source, fast electrostatic beam blanker (1 MHz) and precession unit (72 kHz), …

The Aquilos 2 is a dual beam FIB-SEM platform specifically designed for sectioning of cryo-fixed samples, producing thin lamellae suitable for cryo-electron tomography at an TEM in an automated batch method. Updated with the integrated fluorescence microscopy module – METEOR system and CERES ice shield (Delmic), our Aquilos 2 allows …

The TFS Spectra 300 is a state-of-the-art FEG Scanning Transmission Electron Microscope (S/TEM) with a high-tension voltage range of 30 kV – 300 kV. It is completely enclosed in a casing, specially designed to dampen acoustic and temperature variations from the environment. This enclosure not only makes it possible to …

ThermoFisher Talos Arctica at 200 kV for cryo-EM data collection

The Talos Arctica is equipped with a Gatan Bioquantum K3 detector. For negative staining and cryo-EM, we use a ThermoFisher Talos L120C from ThermoFisher Instruments.

Thermo Fischer on Talos Arctica

The Talos L120C Electron microscope is a robust tool routinely used for initial screening of a biological sample’s purity and homogeneity. The main application at the ER-C is negative staining – a heavy metal embedding of purified proteins at room temperature (see image). In addition, the evaluation of sample quality …

The Krios G4 (Thermo-Fisher Scientific) is a 300 kV FEG cryo-electron microscope with X-FEG field emitter and a three-lens condenser system. The detector options are a Gatan BioContinuum energy filter mounted K3 direct electron detection camera and a bottom mounted Falcon 4(i) detector (FEI). Combined with fringe-free imaging (FFI) and …

The Thales TH9438 9“ is an X-ray detector.

ThermoFischer Themis 300

Probe Corrected (S)TEM

Configuration

• High Tension: 80, 200, 300 kV
• X-FEG
• Aberration corrected (STEM)
• BF-/seg. DF-/HAADF-STEM detector
• Super-X EDX detector
• Dectris pixelated detector
• NanoMegas ASTAR system

Resolution

###300 kV
Point Resolution TEM [nm]: 0.2
Information Limit TEM [nm]: 0.1
Resolution STEM [nm]: 0.08

###200 kV
Point Resolution …

Double Corrected Analytical (S)TEM

##Configuration

• High Tension: 60, 80, 300 kV
• X-FEG
• Monochromator
• Double aberration corrected (TEM and STEM)
• Super-X EDX detector
• BF-/seg. DF-/HAADF-STEM detector
• Gatan Oneview IS camera
• Gatan GIF Continuum 970 HighRes + K3 IS camera

#Resolution

300 kV

Information Limit TEM [nm] : 0.06
Information Limit field-free …

A Talos F200i Transmission Electron Microscope. It has an XFEG with alignments for both 80kv and 200kV, and is capable of HRTEM or STEM imaging. The microscope has the following capabilities:

• NANOMEGAS (Precession Electron Diffraction & Strain mapping solution for TEM/STEM)
• CETA 16M camera (4kx4k)
• Brueker Dual-X EDS detector
• Tomography …