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Tecnai F20 ST

Site:

Karlsruhe

The Tecnai F20 is a S/TEM microscope.

Access
Operated as part of the Karlsruhe Nano Micro Facility. Proposal based access; see:

Link: https://www.knmf.kit.edu/
Tecnai F20 ST Image
Tecnai F20 ST
©KIT
Weblinks
www.int.kit.edu/600…

Tecnai F20 ST in Helmholtz Imaging CONNECT:

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Facility
Karlsruhe Nano Micro Facility for Information-driven Material Structuring and Characterization (KNMFi)

KNMFi is a high-tech platform for information-driven structuring and characterizing a multitude of functional materials at the micro- and nanoscale.

The Karlsruhe Nano Micro Facility for Information-driven Material Structuring and Characterization (KNMFi) offers access to …

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Center
Karlsruher Institut für Technologie (KIT)

KIT is 'The Research University in the Helmholtz Association.' As one of the biggest science institutions in Europe, the only German University of Excellence with national large-scale research facilities combines a long university tradition with …

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Lab
Joint Lab Model Driven Materials Characterization (JL MDMC)

JL MDMC will initially focus on materials characterization using three techniques: electron microscopy in the Ernst Ruska-Centre (ER-C) in FZJ and the Karlsruhe Nano Micro Facility (KMNF) at KIT, nuclear magnetic resonance in the KNMF …

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Modality
Scanning Electron Microscopy (SEM)

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, …

See also:

HZDR on SEM and Department of Analytics

HZB on SEM

KIT Laboratory for Electron Microscopy / Service / Scanning ELectron Microscopy

HZI Central Facility for Microscopy

GFZ Potsdam Imaging and Spectral Analysis (PISA) …

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Modality
Transmission electron microscopy (TEM)

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm …

In transmission electron microscopy an electron beam is going through a very thin sample (usually < 100 nm thick). Due to the shorter wavelength of the electrons a far higher resolution can be obtained as …

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Solution
Tool for extracting scanning electron microscopy (SEM) metadata from TIFF images

This python based tool extracts metadata from machine generated scanning microscopy images in the TIFF format. Currently only metadata from SEMs manufactured by Zeiss, and acquired by their own software is supported. In future, metadata …

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