The ROFEX I is operated by Helmholtz-Zentrum Dresden-Rossendorf.

The ROFEX II is operated by Helmholtz-Zentrum Dresden-Rossendorf.

Auger electron spectroscopy (AES) is used to determine the elemental composition and, in many cases, the chemical state of the atoms in the surface region of a solid, vacuum stable, not insulating material. AES has found widespread use in an extensive variety of materials applications, especially those requiring surface specificity …

• PHI 710 Scanning Auger Nanoprobe instrument
• Energy range, electrons, 1-25 keV
• Nominal lateral resolution < 10 nm (elements with low concentrations)
• Coaxial cylindrical mirror analyser
• Argon ion gun (5 kV) for surface cleaning, charge neutralization and Auger compositional depth profiling
• Image registration to enhance imaging stability
• Motorized five-axis specimen stage …

Field-emitting scanning electron microscope with Bruker Quantax XFlash Flat Quad energy-dispersive X-ray spectrometer.

high-resolution imaging (SE, BSE, STEM)
elemental nano-analytics

Description:
- Tungsten cathode
- Acceleration voltage 0.2 - 30 kV
- Resolution: 3 nm at 30 kV
- Detectors:
- Everhart-Thornley secondary electron detector
- 4 quadrant backscatter electron detector
- Chamber: diameter: 365 mm; high: 255 mm
- 5-Axes motorised compucentric specimen stage

"Sentinel-2 is an Earth observation mission from the Copernicus Programme that systematically acquires optical imagery at high spatial resolution (10 m to 60 m) over land and coastal waters. The mission is currently a constellation with two satellites, Sentinel-2A and Sentinel-2B; a third satellite, Sentinel-2C, is currently undergoing testing in …

Equipment

STOE StadiVari goniometer
DECTRIS PILATUS pixel detector (300 K)
Microfoci X-ray sources (Cu- and Mo-radiation)

Single-crystal X-ray diffraction (SC-XRD) is the most powerful and reliable method for structure determination of chemical substances in the solid state. It allows us to identify the three-dimensional atomic arrangement of a chemical compound, as well as bond lengths, bond angles and intermolecular interactions. The structure information derived from SC-XRD …

Stereo microscope SMZ 745T (Nikon)

FEI Strata 400 DualBeam FIB equipped with an Omniprobe micromanipulator, Oxford EDX system and GIS (Pt, W, C, SiO2).

This system is designed to be accommodated on AWI’s in house developed underwater-winches (Lochthofen et al. 2021), which are designed to be deployed on moorings for year-round operation. It is consisting of a camera housing incorporating an industrial camera with 4Mpixel and a computing unit as well as a light …

The cryogenically cooled NIRvana® LN is unbeatable on sensitivity. For the faintest samples and the longest exposures, the NIRvana® LN can deliver exposure times of 60+ minutes.
- 850 – 1550nm SWIR / NIR-II
- Most sensitive SWIR camera
- 15e- Read Noise
- 10e- Dark Current

Elektronenquelle

• Typ: X-FEG
• Beschleunigungsspannung: 200 kV
  Richtstrahlwert: 1.8 x 109 A cm-2 sr-1 (bei 200 kV)

Beleuchtung

• 2-Kondensorlinsen-System

Abbildung

• Objektiv: A-Twin-Linse
• TEM-Informationslimit: 0.12 nm
• TEM-Punktauflösung: 0.25 nm
• STEM-HAADF-Auflösung: 0.16 nm

Kameras und Detektoren

• 16-Megapixel CMOS-Kamera (FEI Ceta 16M) für TEM
• Großwinkeldunkelfelddetektor (HAADF) für STEM
• On-Axis Hellfeld-/Dunkelfeld-Detektor (BF/DF) für STEM

Energiedispersive …

The Tecnai F20 is a S/TEM microscope.

Tescan Solaris X DualBeam FIB equipped with Omniprobe micromanipulator and option for 3D Slice&View and TEM sample preparation.
The Tescan Solaris X, is a combination of a scanning electron microscope (SEM) and a focused ion beam (FIB) system, which allows imaging and structuring of materials at the nanoscale.

Configuration

• Operation …

The Tescan Tensor STEM is an integrated analytical precession-assisted 4D-STEM instrument for multimodal characterization of nanoscale morphological, chemical, structural and crystallographic properties of a wide range of materials systems. It is equipped with a Schottky field emission electron source, fast electrostatic beam blanker (1 MHz) and precession unit (72 kHz), …

The Aquilos 2 is a dual beam FIB-SEM platform specifically designed for sectioning of cryo-fixed samples, producing thin lamellae suitable for cryo-electron tomography at an TEM in an automated batch method. Updated with the integrated fluorescence microscopy module – METEOR system and CERES ice shield (Delmic), our Aquilos 2 allows …