Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS)
Site:
Eggenstein-Leopoldshafen
RESOLUTION
(nm)
150.0
-
-
The instrument is operated by the Laboratory for Microscopy and Spectroscopy from KIT.
Features
- Bi/Mn Source (Bi+, Bi3+, Bi3++, Mn+)
- Mass resolution: up to 11000 m/Δm @ 29 amu (bunched mode)
- Spatial resolution < 150 nm (collimated mode)
- Surface sensitivity < 5 nm
- Cs thermion source and O2 EI source for sputter depth profiling, Zalar-rotation possible
- Argon cluster ion source for analysis and sputter depth profiling of organic samples
- Transfer vessel for atmosphere contact free sample transport from glove boxes to the spectrometer
- Sample heating and cooling in UHV
- Max sample size: 6×7 cm
Time-of-Flight Secondary Ion Mass Spectrometer in Helmholtz Imaging CONNECT:
Expert
Helmholtz Imaging Support
Helmholtz Imaging offers support for any imaging challenge, independent of the modality.
If you do not find the expert here you are looking for, please don't hesitate to contact us!
No application found.
No solution found.
