Themis 300
Site:
Karlsruhe
ThermoFischer Themis 300
Probe Corrected (S)TEM
Configuration
- High Tension: 80, 200, 300 kV
- X-FEG
- Aberration corrected (STEM)
- BF-/seg. DF-/HAADF-STEM detector
- Super-X EDX detector
- Dectris pixelated detector
- NanoMegas ASTAR system
Resolution
300 kV
Point Resolution TEM [nm]: 0.2
Information Limit TEM [nm]: 0.1
Resolution STEM [nm]: 0.08
200 kV
Point Resolution TEM [nm]: 0.24
Information Limit TEM [nm]: 0.1
Resolution STEM [nm]: 0.1
80 kV
Resolution STEM [nm]: 0.14
Imaging and Analysis Techniques
- BF-TEM & HRTEM
- BF-/DF-/HAADF-STEM
- 4D-STEM: DPC/iDPC/PDF & ACOM
- EDX Analysis
- (S)TEM & EDX tomography
- Electron diffraction
- Lorentz imaging
- Low-dose techniques & cryo imaging
Access
Operated as part of the Karlsruhe Nano Micro Facility. Proposal based access; see:
Link: https://www.knmf.kit.edu/
Link: https://www.knmf.kit.edu/
Weblinks
Themis 300 in Helmholtz Imaging CONNECT:
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