Themis 300

Site:

Karlsruhe

ThermoFischer Themis 300


Probe Corrected (S)TEM


Configuration



  • High Tension: 80, 200, 300 kV

  • X-FEG

  • Aberration corrected (STEM)

  • BF-/seg. DF-/HAADF-STEM detector

  • Super-X EDX detector

  • Dectris pixelated detector

  • NanoMegas ASTAR system


Resolution


###300 kV

Point Resolution TEM [nm]: 0.2

Information Limit TEM [nm]: 0.1

Resolution STEM [nm]: 0.08


###200 kV

Point Resolution TEM [nm]: 0.24

Information Limit TEM [nm]: 0.1

Resolution STEM [nm]: 0.1


###80 kV

Resolution STEM [nm]: 0.14


##Imaging and Analysis Techniques



  • BF-TEM & HRTEM

  • BF-/DF-/HAADF-STEM

  • 4D-STEM: DPC/iDPC/PDF & ACOM

  • EDX Analysis

  • (S)TEM & EDX tomography

  • Electron diffraction

  • Lorentz imaging

  • Low-dose techniques & cryo imaging


Access
Operated as part of the Karlsruhe Nano Micro Facility. Proposal based access; see:

Link: https://www.knmf.kit.edu/
Themis 300 Image

Helmholtz Imaging spinning wheel

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