Themis 300

Site:

Karlsruhe

ThermoFischer Themis 300

Probe Corrected (S)TEM

Configuration

  • High Tension: 80, 200, 300 kV
  • X-FEG
  • Aberration corrected (STEM)
  • BF-/seg. DF-/HAADF-STEM detector
  • Super-X EDX detector
  • Dectris pixelated detector
  • NanoMegas ASTAR system

Resolution

300 kV

Point Resolution TEM [nm]: 0.2
Information Limit TEM [nm]: 0.1
Resolution STEM [nm]: 0.08

200 kV

Point Resolution TEM [nm]: 0.24
Information Limit TEM [nm]: 0.1
Resolution STEM [nm]: 0.1

80 kV

Resolution STEM [nm]: 0.14

Imaging and Analysis Techniques

  • BF-TEM & HRTEM
  • BF-/DF-/HAADF-STEM
  • 4D-STEM: DPC/iDPC/PDF & ACOM
  • EDX Analysis
  • (S)TEM & EDX tomography
  • Electron diffraction
  • Lorentz imaging
  • Low-dose techniques & cryo imaging

Access
Operated as part of the Karlsruhe Nano Micro Facility. Proposal based access; see:

Link: https://www.knmf.kit.edu/
Themis 300 Image

Helmholtz Imaging spinning wheel

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