Themis-Z
Site:
Karlsruhe
Double Corrected Analytical (S)TEM
Configuration
- High Tension: 60, 80, 300 kV
- X-FEG
- Monochromator
- Double aberration corrected (TEM and STEM)
- Super-X EDX detector
- BF-/seg. DF-/HAADF-STEM detector
- Gatan Oneview IS camera
- Gatan GIF Continuum 970 HighRes + K3 IS camera
Resolution
300 kV
Information Limit TEM [nm] : 0.06
Information Limit field-free TEM [nm]: 1.0
Resolution STEM [nm] : 0.059
Resolution field-free STEM [nm]: 4.0
EELS Energy Resolution [eV]: 0.135
80 kV
Information Limit TEM [nm] : 0.09
Resolution STEM [nm] : 0.08
EELS Energy Resolution [eV]: 0.135
60 kV
Information Limit TEM [nm] : 0.096
Resolution STEM [nm] : 0.1
EELS Energy Resolution [eV]: 0.135
Imaging and Analysis Techniques
- BF-TEM & HRTEM
- BF-/DF-/HAADF-STEM
- 4D-STEM: DPC/iDPC/PDF
- EFTEM, EELS, EDX Analysis
- (S)TEM & EDX tomography
- Electron diffraction
- Lorentz imaging
- Low-dose techniques & cryo imaging
- AXON & Clarity in-situ integration
Access
Operated as part of the Karlsruhe Nano Micro Facility.
Proposal based access; see:
Link: https://www.knmf.kit.edu/
Link: https://www.knmf.kit.edu/
Weblinks
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