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Double Corrected Analytical (S)TEM


##Configuration



  • High Tension: 60, 80, 300 kV

  • X-FEG

  • Monochromator

  • Double aberration corrected (TEM and STEM)

  • Super-X EDX detector

  • BF-/seg. DF-/HAADF-STEM detector

  • Gatan Oneview IS camera

  • Gatan GIF Continuum 970 HighRes + K3 IS camera


#Resolution


300 kV


Information Limit TEM [nm] : 0.06

Information Limit field-free TEM [nm]: 1.0

Resolution STEM [nm] : 0.059

Resolution field-free STEM [nm]: 4.0

EELS Energy Resolution [eV]: 0.135


80 kV


Information Limit TEM [nm] : 0.09

Resolution STEM [nm] : 0.08

EELS Energy Resolution [eV]: 0.135


60 kV


Information Limit TEM [nm] : 0.096

Resolution STEM [nm] : 0.1

EELS Energy Resolution [eV]: 0.135


Imaging and Analysis Techniques



  • BF-TEM & HRTEM

  • BF-/DF-/HAADF-STEM

  • 4D-STEM: DPC/iDPC/PDF

  • EFTEM, EELS, EDX Analysis

  • (S)TEM & EDX tomography

  • Electron diffraction

  • Lorentz imaging

  • Low-dose techniques & cryo imaging

  • AXON & Clarity in-situ integration


Access
Operated as part of the Karlsruhe Nano Micro Facility. Proposal based access; see:

Link: https://www.knmf.kit.edu/
Themis-Z Image
ThermoFisher Themis-Z
©KIT
Weblinks
www.int.kit.edu/6006.php

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