Titan 80-300 (FEI)
Site:
Dresden
RESOLUTION
(nm)
0.1
0.136
-
ENERGY
(eV)
136.0
Electron source
- Type: S-FEG
- Accelerating voltages: 80 kV, 300 kV
- Brightness: ~108 A cm-2 sr-1
Illumination
- 3-condenser lens system
Imaging
- Objective: S-Twin lens with imaging corrector (CEOS)
- TEM information limit: 0.10 nm
- STEM-HAADF resolution: 0.136 nm
Cameras and detectors
- 4-megapixel CCD camera (Gatan, UltraScan 1000) for TEM
- High-angle annular dark-field (HAADF) detector for STEM
Energy-Dispersive X-ray Spectroscopy (EDXS)
- Retractable X-ray fluorescence detector (EDAX)
- Effective solid angle: 0.13 sr
- Energy resolution: 136 eV (Mn-Kα)
- Element detection for Z ≥ 5
Electron Energy-Loss Spectroscopy (EELS) and Energy-Filtered TEM (EFTEM)
- Imaging energy filter Gatan GIF Tridiem 863
- 4-megapixel CCD camera (Gatan, UltraScan 1000)
- Energy resolution: 0.7 eV
Specimen holders
- Single-tilt holder
- 2 low-background double-tilt holders with Be hex-ring
- In-situ single-tilt holder for heating experiments up to 1000 °C (Philips, Modell PW6592)
Weblinks
Titan 80-300 in Helmholtz Imaging CONNECT:
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