The HZDR department Reactive Transport uses a Nikon XTH 225 scanner that is suited for the study of common GeoPET samples with a diameter up to 100 mm.

Source

• Open microfocus x-ray source, power 225 kV at max. 1 mA permanently, minimum focal spot size 3 µm at 80 kV, …

The measurement principle for both X-ray and neutron imaging is based on the material-dependent attenuation of the transmitted X-ray respectively neutron beam intensity. The output of all imaging experiments are grey-scale image sequences showing the two-dimensional (and hence depth-limited) projection of rising bubbles and moving particles within the liquid metal …

Mobile tomographic setup developed to investigate cuneiform tablets within the cluster of excellence at the university of Hamburg 'Understanding written Artifacts'.

Detailed capture and measurement of internal component and assembly features is often vital for quality control, failure analysis and material research. XT H 225 offers a powerful micro-focus X-ray source, a large inspection volume, and high X-ray and CT imaging resolution. XT H 225 suits a wide range of applications, …

Yellowscan Mapper II LiDAR

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hyperspectral camera at HZDR

The Zeiss Auriga 60 Dual Beam FIB is a combination of a scanning electron microscope (SEM) and a focused ion beam (FIB) system, which allows imaging and structuring of materials at the nanoscale. It is a DualBeam FIB with EDX, EBSD and vacuum transfer system.

It is equipped with an …

Open Microscope System for Automated Material Analysis​

Zeiss on AXIO Imager.M2m

Microscope for most common optical imaging requirements of materials laboratories

Zeiss on Axioscope 7

scanning electron microscope

Zeiss on EVO 10

The Zeiss mager.Z2 AXIO is a fluorescence microscope.

Zeiss on mager.Z2 AXIO

This Scanning Electron Microscope is operated at Hereon.

confocal laser scanning microscope LSM 800 for material applications and analysis

Zeiss on LSM800

The Zeiss Merlin VP is a scanning electron microscope.

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Field-emitting scanning electron microscope with Bruker Quantax XFlash Flat Quad energy-dispersive X-ray spectrometer.

high-resolution imaging (SE, BSE, STEM)
elemental nano-analytics

Zeiss on Observer.Z1

The Zeiss ORION NanoFab is a microscope with sub-nanometer resolution. It is operated with He and Ne ion beams.

A scanning helium ion microscope is an imaging technology based on a scanning helium ion beam. Similar to other focused ion beam techniques, it allows to combine milling and cutting of samples with their observation at sub-nanometer resolution.

In terms of imaging, HIM has several advantages over the traditional scanning …

Scanning Electron Microscope

Zeiss on Supra

The Field Emission-Scanning Electron Microscope of the Zeiss Ultra Plus allow you to capture, analyze and supplement high-resolution images to get total information out of your sample. The complete detection system of the Ultra Plus combines a high-tech Gemini FE-SEM column with various detectors: the In-lens & SE-Detector for high …

Since late 2016, the Institute for Applied Materials (KIT) has an X-ray microscope (Xradia 520 Versa) with sub-μm resolution for 3D X-ray microscopy, which offers a spatial resolution below 0.7 µm with available voxel sizes of 70 nm [1].

KIT on X-ray tomography

Zeiss on Xradia 520 Versa

NanoCT (Xradia Ultra 810 X-ray microscope) enables the non-destructive structural characterization of three-dimensional samples with resolution down to 50 nm. In this non-invasive X-ray microscopy technique, the sample is positioned in the focal spot of the X-ray beam and 2D X-ray radiographs of the sample are acquired at different angles. …