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Instrument
X-ray Tomography Scanner ENCI (ENCI)

Mobile tomographic setup developed to investigate cuneiform tablets within the cluster of excellence at the university of Hamburg 'Understanding written Artifacts'.

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Instrument
X-tek XTH225 (Nikon metrology) (XTH225)

Detailed capture and measurement of internal component and assembly features is often vital for quality control, failure analysis and material research. XT H 225 offers a powerful micro-focus X-ray source, a large inspection volume, and high X-ray and CT imaging resolution. XT H 225 suits a wide range of applications, …

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Instrument
Yellowscan Mapper II

Yellowscan Mapper II LiDAR

See also:

hyperspectral camera at HZDR

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Instrument
Zeiss Auriga 60 (Auriga 60)
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The Zeiss Auriga 60 Dual Beam FIB is a combination of a scanning electron microscope (SEM) and a focused ion beam (FIB) system, which allows imaging and structuring of materials at the nanoscale. It is a DualBeam FIB with EDX, EBSD and vacuum transfer system.

It is equipped with an …

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Instrument
Zeiss AXIO Imager.M2m

Open Microscope System for Automated Material Analysis​

Zeiss on AXIO Imager.M2m

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Instrument
Zeiss Axioscope 7

Microscope for most common optical imaging requirements of materials laboratories

Zeiss on Axioscope 7

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Instrument
Zeiss EVO 10

scanning electron microscope

Zeiss on EVO 10

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Instrument
Zeiss Imager.Z2 AXIO

The Zeiss mager.Z2 AXIO is a fluorescence microscope.

Zeiss on mager.Z2 AXIO

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Instrument
Zeiss Leo 1530

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Instrument
Zeiss Leo 1550 VP

This Scanning Electron Microscope is operated at Hereon.

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Instrument
Zeiss LSM 800 Airyscan

confocal laser scanning microscope LSM 800 for material applications and analysis

Zeiss on LSM800

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Instrument
Zeiss Merlin

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Instrument
Zeiss Merlin VP (Leipzig)

The Zeiss Merlin VP is a scanning electron microscope.

Download description from UFZ

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Instrument
Zeiss Merlin VP Compact (SEM/EDX)

Field-emitting scanning electron microscope with Bruker Quantax XFlash Flat Quad energy-dispersive X-ray spectrometer.

high-resolution imaging (SE, BSE, STEM)
elemental nano-analytics

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Instrument
Zeiss Observer.Z1 AXIO

Zeiss on Observer.Z1

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Instrument
Zeiss Orion NanoFab

The Zeiss ORION NanoFab is a microscope with sub-nanometer resolution. It is operated with He and Ne ion beams.

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Instrument
Zeiss Orion NanoFab helium ion microscope (HIM)

A scanning helium ion microscope is an imaging technology based on a scanning helium ion beam. Similar to other focused ion beam techniques, it allows to combine milling and cutting of samples with their observation at sub-nanometer resolution.

In terms of imaging, HIM has several advantages over the traditional scanning …

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Instrument
Zeiss Supra 40VP

Scanning Electron Microscope

Zeiss on Supra

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Instrument
Zeiss UltraPlus

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Instrument
Zeiss Ultra Plus Scanning Electron Microscope

The Field Emission-Scanning Electron Microscope of the Zeiss Ultra Plus allow you to capture, analyze and supplement high-resolution images to get total information out of your sample. The complete detection system of the Ultra Plus combines a high-tech Gemini FE-SEM column with various detectors: the In-lens & SE-Detector for high …

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Instrument
Zeiss Xradia 520 Versa

Since late 2016, the Institute for Applied Materials (KIT) has an X-ray microscope (Xradia 520 Versa) with sub-μm resolution for 3D X-ray microscopy, which offers a spatial resolution below 0.7 µm with available voxel sizes of 70 nm [1].

KIT on X-ray tomography

Zeiss on Xradia 520 Versa

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Instrument
Zeiss Xradia 810 Ultra (nanoCT)
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NanoCT (Xradia Ultra 810 X-ray microscope) enables the non-destructive structural characterization of three-dimensional samples with resolution down to 50 nm. In this non-invasive X-ray microscopy technique, the sample is positioned in the focal spot of the X-ray beam and 2D X-ray radiographs of the sample are acquired at different angles. …

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