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Scanning Auger Microscope (SAM)

Site:

Hamburg

RESOLUTION (nm)
-   10.0  -
ENERGY (keV)
25.0
DETECTOR
PHI 710 Scanning Auger Nanoprobe


  • PHI 710 Scanning Auger Nanoprobe instrument

  • Energy range, electrons, 1-25 keV

  • Nominal lateral resolution < 10 nm (elements with low concentrations)

  • Coaxial cylindrical mirror analyser

  • Argon ion gun (5 kV) for surface cleaning, charge neutralization and Auger compositional depth profiling

  • Image registration to enhance imaging stability

  • Motorized five-axis specimen stage

  • Intro camera and ion gauge

  • Navigation software to re-localize pre-defined positions on the sample surface


Acquisition Parameter:

Image registration to enhance imaging stability



Helmholtz Imaging spinning wheel

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