P05 microtomography @ PETRA III
Hamburg
he second experimental hutch contains the micro tomography setup of P05. At a sample distance of 87 m from the source, the horizontal full width at half maximum of the beam is 5.6 mm which is sufficient to investigate millimeter sized samples with a spatial resolution down to the micrometer range. The versatile setup allows for high speed, high resolution and extended field of view imaging using a range of different detectors specifically suited to the custom made microscope optics of the detector system. Ample space, a high payload and a special sample environment frame allow for easy integration of sample environments. The system is equipped with a sample changer robot which can change up to 20 samples without manual interference.
P05 microtomography @ PETRA III in Helmholtz Imaging CONNECT:
Hard X-ray full-field nanotomography is an ideal technique to study the inner structure of materials non-destructively at high spatial resolution, covering research areas suchas material science, biology and medical research.
(from https://bib-pubdb1.desy.de/record/471334)