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Tool for extracting scanning electron microscopy (SEM) metadata from TIFF images

Authors: Reetu Elza Joseph, Rossella Aversa, Elias Vitali, Nicolas Blumenröhr

Keywords: SEM, Metadat extraction, mapping, schema, scanning electron microscopy

This python based tool extracts metadata from machine generated scanning microscopy images in the TIFF format. Currently only metadata from SEMs manufactured by Zeiss, and acquired by their own software is supported. In future, metadata from machines developed by other manufacturers, and produced by other softwares would also be included. Ideally the tool would be integrated with an interface which enables the user to select the manufacturer and software, and upload the SEM image(s) in TIFF format. Other formats could also be included in the future. The output of the tool will be a json file with the extracted metadata which follows the SEM JSON schema available at KIT Data Manager/ Metadata Schemas for Materials Science on GitHub. This schema is constantly under development based on the feedback that we receive from users. It was first published at CEUR Workshop Proceedings @ https://ceur-ws.org/Vol-3036/paper21.pdf

License
CC0-1.0 license

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