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Strata 400 FIB (Strata 400)

Site:

Karlsruhe

FEI Strata 400 DualBeam FIB equipped with an Omniprobe micromanipulator, Oxford EDX system and GIS (Pt, W, C, SiO2).

Access

Operated as part of the Karlsruhe Nano Micro Facility. Proposal based access; see:

Link: https://www.knmf.kit.edu/

FEI Strata 400

©KIT

Weblinks

www.int.kit.edu/658…

Strata 400 FIB in Helmholtz Imaging CONNECT:

Expert

Christian Kübel

Karlsruher Institut für Technologie - Karlsruhe

Research interests include the use of
- (analytical) electron microscopy
- electron tomography incl. quantitative 3D analysis
- 4D-STEM imaging and statistical analysis
- (high-speed) in-situ TEM
with applications in materials sciences (catalysis, batteries, glass, magnetic materials)

In Helmholtz Imaging CONNECT
➤Modalities: 6 ➤Applications: 7 ➤Instruments: 5 ➤Labs: 1 ➤Facilities: 1 ➤Centers: 1 ➤Solutions: 5

Expert

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Facility

Karlsruhe Nano Micro Facility for Information-driven Material Structuring and Characterization (KNMFi)

KNMFi is a high-tech platform for information-driven structuring and characterizing a multitude of functional materials at the micro- and nanoscale.

The Karlsruhe Nano Micro Facility for Information-driven Material Structuring and Characterization (KNMFi) offers access to …

In Helmholtz Imaging CONNECT
➤Applications: 0 ➤Centers: 1 ➤Instruments: 16 ➤Labs: 2 ➤Modalities: 27 ➤Experts: 6 ➤Solutions: 0

Center

Karlsruher Institut für Technologie (KIT)

KIT is 'The Research University in the Helmholtz Association.' As one of the biggest science institutions in Europe, the only German University of Excellence with national large-scale research facilities combines a long university tradition with …

In Helmholtz Imaging CONNECT
➤Applications: 17 ➤Facilities: 7 ➤Instruments: 32 ➤Labs: 7 ➤Modalities: 52 ➤Experts: 17 ➤Solutions: 6

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Modality

Dual-beam Focused Ion Beam (Dual-Beam-FIB)

In Helmholtz Imaging CONNECT
➤Applications: 2 ➤Facilities: 2 ➤Centers: 2 ➤Instruments: 4 ➤Labs: 0 ➤Experts: 1 ➤Solutions: 0

Modality

Focused ion beam (FIB)

Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup …

In Helmholtz Imaging CONNECT
➤Applications: 2 ➤Facilities: 3 ➤Centers: 4 ➤Instruments: 7 ➤Labs: 0 ➤Experts: 1 ➤Solutions: 0

Modality

Focused ion beam scanning electron microscopy (FIB SEM)