The FEI Titan G2 80-200 ChemiSTEM is a fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale …

The Phoenix Nanotom® M is a nanofocus X-ray CT system for scientific and industrial computed tomography (microCT and nanoCT®) and 3D metrology. The system realizes a unique spatial and contrast resolution on a wide sample …

The Göttingen Instrument for Nano-Imaging with X-Rays (GINIX) is a dedicated endstation for coherent nano-diffraction and imaging at the Coherence Beamline P10. It is located in the second experimental hutch (EH2).

The Coherence Beamline P10 …

The High Energy Density (HED) scientific instrument, together with the HIBEF user consortium, is a new, unique platform for experiments combining hard X-ray FEL radiation and the capability to generate matter under extreme conditions of …

The scope of the MID instrument are material science experiments using the unprecedented coherent properties of the X-ray laser beams of the European XFEL. The scientific applications reach from condensed matter physics, studying for example …

The imaging beamline (IBL) is dedicated to micro- and nanotomography at energies between 5 keV and 50 keV. The flexible design of the experimental stations allows for the investigation of samples with diameters ranging seamlessly …

he second experimental hutch contains the micro tomography setup of P05. At a sample distance of 87 m from the source, the horizontal full width at half maximum of the beam is 5.6 mm which …

The nanotomography endstation in the experimental hutch 1, designed to allow 3D resolutions of below 100 nm, is currently under construction. As X-ray optics we will use compound refractive lenses (CRLs), made from SU-8 polymer …

The High Energy Materials Science Beamline HEMS at PETRA III satisfies high energy x-ray diffraction (XRD) and imaging techniques. It is tunable in the range 30 to 200 keV, and it is optimized for micrometer …

Field-emitting scanning electron microscope with Bruker Quantax XFlash Flat Quad energy-dispersive X-ray spectrometer.

high-resolution imaging (SE, BSE, STEM)
elemental nano-analytics

ThermoFischer Themis 300

Probe Corrected (S)TEM

Configuration

• High Tension: 80, 200, 300 kV
• X-FEG
• Aberration corrected (STEM)
• BF-/seg. DF-/HAADF-STEM detector
• Super-X EDX detector
• Dectris pixelated detector
• NanoMegas ASTAR system

Resolution

300 kV

Point Resolution TEM …

A Talos F200i Transmission Electron Microscope. It has an XFEG with alignments for both 80kv and 200kV, and is capable of HRTEM or STEM imaging. The microscope has the following capabilities:
- NANOMEGAS (Precession Electron …

The HZDR department Reactive Transport uses a Nikon XTH 225 scanner that is suited for the study of common GeoPET samples with a diameter up to 100 mm.

Source

• Open microfocus x-ray source, power 225 …

Field-emitting scanning electron microscope with Bruker Quantax XFlash Flat Quad energy-dispersive X-ray spectrometer.

high-resolution imaging (SE, BSE, STEM)
elemental nano-analytics