The Phoenix Nanotom® M is a nanofocus X-ray CT system for scientific and industrial computed tomography (microCT and nanoCT®) and 3D metrology. The system realizes a unique spatial and contrast resolution on a wide sample …

IONTOF ToF.SIMS.5 time-of-flight secondary ion mass spectrometer

The imaging beamline (IBL) is dedicated to micro- and nanotomography at energies between 5 keV and 50 keV. The flexible design of the experimental stations allows for the investigation of samples with diameters ranging seamlessly …

he second experimental hutch contains the micro tomography setup of P05. At a sample distance of 87 m from the source, the horizontal full width at half maximum of the beam is 5.6 mm which …

The nanotomography endstation in the experimental hutch 1, designed to allow 3D resolutions of below 100 nm, is currently under construction. As X-ray optics we will use compound refractive lenses (CRLs), made from SU-8 polymer …

ThermoFischer Themis 300

Probe Corrected (S)TEM

Configuration

• High Tension: 80, 200, 300 kV
• X-FEG
• Aberration corrected (STEM)
• BF-/seg. DF-/HAADF-STEM detector
• Super-X EDX detector
• Dectris pixelated detector
• NanoMegas ASTAR system

Resolution

300 kV

Point Resolution TEM …

A Talos F200i Transmission Electron Microscope. It has an XFEG with alignments for both 80kv and 200kV, and is capable of HRTEM or STEM imaging. The microscope has the following capabilities:
- NANOMEGAS (Precession Electron …

Field-emitting scanning electron microscope with Bruker Quantax XFlash Flat Quad energy-dispersive X-ray spectrometer.

high-resolution imaging (SE, BSE, STEM)
elemental nano-analytics

A scanning helium ion microscope is an imaging technology based on a scanning helium ion beam. Similar to other focused ion beam techniques, it allows to combine milling and cutting of samples with their observation …