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IONTOF ToFSIMS 5 (ToFSIMS)

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Leipzig

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IONTOF ToF.SIMS.5 time-of-flight secondary ion mass spectrometer

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Dr. Hryhoriy Stryhanyuk gregory.stryhanyuk@ufz.de +49 341 235 1359

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Materials science is an interdisciplinary field of researching and discovering materials. Materials engineering is an engineering field of finding uses for materials in other fields and industries. The intellectual origins of materials science stem from …

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ProVIS - Center for Chemical Microscopy (ProVIS)

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ProVIS - Centre for Chemical Microscopy

The ProVIS - Centre for Chemical Microscopy is an unique research platform that combines high resolution structural and chemical imaging with high resolution mass spectrometry for metabolomics, proteomics and metallomics. The mission of ProVIS is …

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Modality

Secondary Ion Mass Spectrometry (SIMS)

Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing …

IONTOF ToFSIMS 5 (ToFSIMS)

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