X-tek XTH225 (Nikon metrology) (XTH225)
Site:
Halle
Detailed capture and measurement of internal component and assembly features is often vital for quality control, failure analysis and material research. XT H 225 offers a powerful micro-focus X-ray source, a large inspection volume, and high X-ray and CT imaging resolution. XT H 225 suits a wide range of applications, including inspection of small castings, plastic parts as well as material research.
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