Go back     Home Modalities Atomic Force Microscopy

Atomic Force Microscopy (AFM)

CC BY-SA 3.0 From Wikipedia on:

Atomic force microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Read more about 'Atomic force microscopy' at: Wikipedia

Wikipedia contributors. "Atomic force microscopy." Wikipedia, The Free Encyclopedia. Wikipedia, The Free Encyclopedia, April 1, 2024.
Atomic Force Microscopy Image

Helmholtz Imaging spinning wheel

Please wait, your data is processed