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Atomic Force Microscopy (AFM)

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Atomic force microscopy


Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

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Wikipedia contributors. "Atomic force microscopy." Wikipedia, The Free Encyclopedia. Wikipedia, The Free Encyclopedia, April 1, 2024.
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