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Ultra-High Vacuum Analysis lab (UHV Lab)

The IPS UHV (ultra-high vacuum) Analysis lab operates a variety of instruments for surface analytics with several UHV growth chambers. Samples be analyzed by standard surface characterization methods such as:

  • reflection high energy electron diffraction (RHEED),
  • low-energy electron diffraction (LEED),
  • Auger electron spectroscopy (AES),
  • X-ray photoelectron spectroscopy (XPS),
  • UHV atomic force microscopy (AFM),
  • UHV scanning tunneling microscopy (STM).

The cluster comprises three chambers built with different materials for different purposes.

Helmholtz Imaging spinning wheel

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