Versatile high-resolution Atomic Force Microscope - AFM

Major operating modes:
• PeakForce tapping mode with ScanAsyst
• QNM (quantitative nanoscale mechanical characterization)
• Tapping / contact mode
• STM mode (scanning tunneling microscopy)
• Force spectroscopy
• Lateral force microscopy (LFM)
• Magnetic force microscopy (MFM)
• TUNA module (electrical conductivity)
• KPFM module (Kelvin probe force microscopy)

Equipment:
• Icon scanner (90 µm x 90 µm)
• NanoScope V SPM control station
• Optical microscope for laser and sample alignment
• Liquid cell
• Electrochemical cell with potentiostat
• Translation stage for nano-positioning
• Heating stage for in situ analysis (-35 °C - +250 °C)