Versatile high-resolution Atomic Force Microscope - AFM

Major operating modes:

• PeakForce tapping mode with ScanAsyst

• QNM (quantitative nanoscale mechanical characterization)

• Tapping / contact mode

• STM mode (scanning tunneling microscopy)

• Force spectroscopy

• Lateral force microscopy (LFM)

• Magnetic force microscopy (MFM)

• TUNA module (electrical conductivity)

• KPFM module (Kelvin probe force microscopy)

Equipment:

• Icon scanner (90 µm x 90 µm)

• NanoScope V SPM control station

• Optical microscope for laser and sample alignment

• Liquid cell

• Electrochemical cell with potentiostat

• Translation stage for nano-positioning

• Heating stage for in situ analysis (-35 °C - +250 °C)