The IPS UHV (ultra-high vacuum) Analysis lab operates a variety of instruments for surface analytics with several UHV growth chambers. Samples be analyzed by standard surface characterization methods such as:
- reflection high energy electron diffraction (RHEED),
- low-energy electron diffraction (LEED),
- Auger electron spectroscopy (AES),
- X-ray photoelectron spectroscopy (XPS),
- UHV atomic …
