PROF. Christian Schroer
CXNS — Center for X-ray and Nano Science, Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany
Helmholtz Imaging, Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany
Department Physik, Universität Hamburg, Luruper Chaussee 149, Hamburg 22761, Germany
My main interests lie in hard X-ray microscopy with synchrotron radiation and free-electron lasers. I develop both instrumentation and methods for 3D imaging with various X-ray analytical techniques as contrast. Algorithmically, my focus lies on solving inverse problems in tomography and imaging with coherent radiation (phase problem).
Publications
The synchrotron radiation source PETRA III and its future ultra-low-emittance upgrade PETRA IV
Schroer C, Wille H, Seeck O, Bagschik K, Schulte-Schrepping H, Tischer M, Graafsma H, Laasch W, Baev K, Klumpp S, Bartolini R, Reichert H, Leemans W, Weckert E - The European Physical Journal Plus - 2022
PETRA IV: the ultralow-emittance source project at DESY
Schroer C, Agapov I, Brefeld W, Brinkmann R, Chae Y, Chao H, Eriksson M, Keil J, Nuel Gavaldà X, Röhlsberger R, Seeck O, Sprung M, Tischer M, Wanzenberg R, Weckert E - International Union of Crystallography (IUCr) - 2018
Perfect X-ray focusing via fitting corrective glasses to aberrated optics
Seiboth F, Schropp A, Scholz M, Wittwer F, Rödel C, Wünsche M, Ullsperger T, Nolte S, Rahomäki J, Parfeniukas K, Giakoumidis S, Vogt U, Wagner U, Rau C, Boesenberg U, Garrevoet J, Falkenberg G, Galtier E, Ja Lee H, Nagler B, Schroer C - Springer Science and Business Media LLC - 2017
Hard x-ray scanning microscopy with coherent radiation: Beyond the resolution of conventional x-ray microscopes
Schropp A, Hoppe R, Patommel J, Samberg D, Seiboth F, Stephan S, Wellenreuther G, Falkenberg G, Schroer C - AIP Publishing - 2012
Mapping the local nanostructure inside a specimen by tomographic small-angle x-ray scattering
Schroer C, Kuhlmann M, Roth S, Gehrke R, Stribeck N, Almendarez-Camarillo A, Lengeler B - AIP Publishing - 2006
Mapping the chemical states of an element inside a sample using tomographic x-ray absorption spectroscopy
Schroer C, Kuhlmann M, Günzler T, Lengeler B, Richwin M, Griesebock B, Lützenkirchen-Hecht D, Frahm R, Ziegler E, Mashayekhi A, Haeffner D, Grunwaldt J, Baiker A - AIP Publishing - 2003
Reconstructing x-ray fluorescence microtomograms
Schroer C - AIP Publishing - 2001
Send mail to Christian Schroer (christian.schroer@desy.de)
