Scanning X-ray microscopy (SXM)
In scanning microscopy, a small but intensive x-ray beam is used to scan the sample. This microbeam is typically generated by an x-ray optic. At each position of the scan, an x-ray analytical signal, such as the x-ray fluorescence, absorption spectroscopy, or diffraction, from the sample is recorded. In this way, elemental, chemical, and (nano-)structural information from the sample can be obtained.
Other modalities related to Scanning X-ray microscopy in Helmholtz Imaging CONNECT:
Scanning X-ray microscopy in Helmholtz Imaging CONNECT:
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