FEI Helios G4 UC – Dual Beam (FIB/SEM)
Potsdam
FEI Helios G4 Dual Beam Helios G4 UC is part of the fourth generation of the leading Helios Dual Beam family. It combines the innovative Elstar electron column with high-current UC+ technology for extreme high-resolution imaging and the highest materials contrast with the superior Tomahawk ion column for the fastest, easiest, and most precise high-quality sample preparation. In addition to the most advanced electron and ion optics, the Helios G4 UC incorporates a suite of state-of-the-art technologies that enable simple and consistent high-resolution S/TEM and Atom Probe Tomography (APT) sample preparation, as well as the highest-quality subsurface and 3D characterization, even on the most challenging samples.
Highest quality TEM sample preparation:
The latest technological innovations of the Helios G4, in combination with the easiest to use, comprehensive software and FEI’s application expertise, allow for the fastest and easiest preparation of HR-S/TEM samples for a wide range of materials. In order to achieve the highest-quality results, final polishing with low energy ions is required to minimize surface damage on the sample. FEI’s Tomahawk Focused Ion Beam (FIB) column not only delivers high-resolution imaging and milling at high voltages, but has also excellent low voltage performance, enabling the creation of high quality TEM lamella.
Key Features:
Fastest and easiest TEM sample preparation
Shortest time to Nano scale information
Reveal the finest details
Precise sample navigation
Artifact-free imaging Fast, accurate and precise milling
Specifications and Detectors:
Elstar extreme high-resolution field emission SEM column.
Resolution: 0.6 nm at 30 kV STEM, 0.7 nm at 1 kV, 1.0 nm at 500 V (ICD).
Electron beam current range: 0.8 pA to 100 nA
Accelerating voltage range: 200 V to 30 kV
Maximum horizontal field width: 2.3 mm at 4 mm WD
Ion beam current range: 0.1 pA to 65 nA
Accelerating Voltage range: 500 V to 30 kV
Elstar in-lens SE/BSE detector
Elstar in-column SE/BSE detector
Everhart-Thornley SE detector (ETD)
Retractable STEM3+ detector with BF/DF/HAADF segments
Gas Injection System
Easylift for precise in situ sample manipulation
AutoTEM wizard automated sample preparation
Link: https://www.gfz.de/fileadmin/gfz/sec35/pdf/PISA_Project_Proposal_Form.pdf