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Cameca nanoSIMS 50L sector-field secondary ion mass spectrometer (nanoSIMS)

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Leipzig

Cameca nanoSIMS 50L sector-field secondary ion mass spectrometer

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Dr. Hryhoriy Stryhanyuk gregory.stryhanyuk@ufz.de +49 341 235 1359

Cameca nanoSIMS 50L sector-field secondary ion mass spectrometer in Helmholtz Imaging CONNECT:

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ProVIS - Center for Chemical Microscopy (ProVIS)

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Helmholtz-Zentrum für Umweltforschung (UFZ)

Biodiversity, functioning ecosystems, clean water and intact soils all make up our natural resource base. In the face of global change, employees at the Helmholtz Centre for Environmental Research – UFZ are united by the …

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ProVIS - Centre for Chemical Microscopy

The ProVIS - Centre for Chemical Microscopy is an unique research platform that combines high resolution structural and chemical imaging with high resolution mass spectrometry for metabolomics, proteomics and metallomics. The mission of ProVIS is …

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Modality

Secondary Ion Mass Spectrometry (SIMS)

Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing …

Cameca nanoSIMS 50L sector-field secondary ion mass spectrometer (nanoSIMS)

Cameca nanoSIMS 50L sector-field secondary ion mass spectrometer in Helmholtz Imaging CONNECT:

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