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Scanning Helium Ion Microscopy (HIM)

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Scanning helium ion microscope


A scanning helium ion microscope (SHIM, HeIM or HIM) is a high-resolution imaging instrument that uses a scanning helium ion beam to visualize at sub-nanometer resolution. It was developed in the mid-2000s for nanotechnology applications, and has been demonstrated to have a better surface resolution than scanning electron microscopes.

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Wikipedia contributors. "Scanning helium ion microscope." Wikipedia, The Free Encyclopedia. Wikipedia, The Free Encyclopedia, May 2, 2026.
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