Scattering-type near-field infrared microscopy (s-SNIM)
Scattering-type near-field infrared microscopy (s-SNIM) allows the investigation of the optical properties of a given structure with resolution beyond the diffraction limit of E. Abbe. The evanescent near-fields at the sample surface are created with an intense laser beam. A small scattering centre immediately above the surface transforms them into propagating waves, the scattered light yielding information about the local near-field (NF) of the sample. This scattering center is practically realized by using the cantilever of an atomic-force microscope (AFM).
*Resource used: * HZDR Infrared and terahertz near-field microscopy
See also:
Departments of the Institute of Ion Beam Physics and Materials Research
Publications
Nonlinear plasmonic response of doped nanowires observed by infrared nanospectroscopy
Lang D, Balaghi L, Winnerl S, Schneider H, Hübner R, Kehr S, Eng L, Helm M, Dimakis E, Pashkin A - Nanotechnology - 2018
