X-ray fluorescence (XRF)
X-ray fluorescence
X-ray fluorescence (XRF) is a powerful non-destructive analytical technique. In simple terms, it works by illuminating a sample with high-energy X-rays, causing the atoms within to become excited and emit their own unique, characteristic X-rays—a process similar to how a blacklight makes certain colors fluoresce. By measuring the energy and intensity of these emitted "secondary" X-rays, scientists can identify which elements are present in the sample and in what quantities. More technically, XRF is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science, archaeology and art objects such as paintings.
Read more about 'X-ray fluorescence' at: WikipediaWikipedia contributors. "X-ray fluorescence." Wikipedia, The Free Encyclopedia. Wikipedia, The Free Encyclopedia, Oct. 20, 2025.
